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Predicting fault prone modules by the Dempster-Shafer belie..:

, In: Proceedings of the 18th IEEE International Conference on Automated Software Engineering,
Guo, Lan ; Cukic, Bojan ; Singh, Harshinder - p. 249-252 , 2003
Link: https://dl.acm.org/doi/10.1109/ASE.2003.1240314