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P-BMS : A Bad Block Management Scheme in Parallelized Fl..:

Kim, Hong Seok ; Nam, Eyee Hyun ; Yun, Ji Hyuck..
ACM Transactions on Embedded Computing Systems (TECS). 16 (2017) 5s - p. 1-19 , 2017

Link: https://dl.acm.org/doi/10.1145/3126550

RT Journal
T1 <Title>P-BMS				: A Bad Block Management Scheme in Parallelized Flash Memory Storage Devices</Title>

UL https://suche.suub.uni-bremen.de/peid=acm-3126550&Exemplar=1&LAN=DE
				
A1 Kim, Hong Seok
A1 Nam, Eyee Hyun
A1 Yun, Ji Hyuck
A1 Lee, Sheayun
A1 Min, Sang Lyul
PB ACM
YR 2017
SN 1539-9087
SN 1558-3465
K1 Bad block
K1 Bad block management
K1 Flash memory
K1 Flash translation layer (FTL)
K1 Hardware acceleration
K1 Parallel processing
K1 Solid-state drive (SSD)
K1 Storage system
K1 Information systems
K1 Information storage systems
K1 Information storage technologies
K1 Storage class memory
K1 Flash memory
K1 Hardware
K1 Integrated circuits
K1 Semiconductor memory
K1 Non-volatile memory
K1 Computer systems organization
K1 Embedded and cyber-physical systems
K1 Embedded systems
K1 Firmware
JF ACM Transactions on Embedded Computing Systems (TECS)
VO 16
IS 5s
SP 1
OP 19
LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3126550
DO https://dl.acm.org/doi/10.1145/3126550
SF ELIB - SuUB Bremen

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