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1 Ergebnisse
1
Experimental and analytical study of Xeon Phi reliability:
, In:
Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis
,
Oliveira, Daniel
;
Pilla, Laércio
;
DeBardeleben, Nathan
... - p. 1-12 , 2017
Link:
https://dl.acm.org/doi/10.1145/3126908.3126960
RT T1
Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis
: T1
Experimental and analytical study of Xeon Phi reliability
UL https://suche.suub.uni-bremen.de/peid=acm-3126960&Exemplar=1&LAN=DE A1 Oliveira, Daniel A1 Pilla, Laércio A1 DeBardeleben, Nathan A1 Blanchard, Sean A1 Quinn, Heather A1 Koren, Israel A1 Navaux, Philippe A1 Rech, Paolo PB ACM YR 2017 K1 fault injection K1 fault tolerance K1 parallel architectures K1 radiation experiments K1 reliability K1 Hardware K1 Robustness K1 Fault tolerance K1 Computer systems organization K1 Architectures K1 Parallel architectures SP 1 OP 12 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3126908.3126960 DO https://dl.acm.org/doi/10.1145/3126908.3126960 SF ELIB - SuUB Bremen
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