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1
Design for testability in a silicon compilation environment:
, In:
Proceedings of the 22nd ACM/IEEE Design Automation Conference
,
Fung, H. S.
;
Hirschhorn, S.
;
Kulkarni, R.
- p. 190-196 , 1985
Link:
https://dl.acm.org/doi/10.5555/317825.317857
RT T1 <cTitle>Proceedings of the 22nd ACM/IEEE Design Automation Conference</cTitle>: T1 <Title>Design for testability in a silicon compilation environment</Title> UL https://suche.suub.uni-bremen.de/peid=acm-317857&Exemplar=1&LAN=DE A1 Fung, H. S. A1 Hirschhorn, S. A1 Kulkarni, R. PB IEEE Press YR 1985 K1 Hardware K1 Robustness K1 Hardware test K1 Very large scale integration design K1 Emerging technologies K1 Analysis and design of emerging devices and systems K1 Emerging languages and compilers K1 Software and its engineering K1 Software notations and tools K1 Compilers K1 Applied computing K1 Physical sciences and engineering K1 Engineering SP 190 OP 196 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/317825.317857 DO https://dl.acm.org/doi/10.5555/317825.317857 SF ELIB - SuUB Bremen
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