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1 Ergebnisse
1
Effective In-Situ Chip Health Monitoring with Selective Mon..:
, In:
Proceedings of the 2018 Great Lakes Symposium on VLSI
,
Ahmadi Balef, Hadi
;
Fatemi, Hamed
;
Goossens, Kees
. - p. 213-218 , 2018
Link:
https://dl.acm.org/doi/10.1145/3194554.3194563
RT T1
Proceedings of the 2018 Great Lakes Symposium on VLSI
: T1
Effective In-Situ Chip Health Monitoring with Selective Monitor Insertion Along Timing Paths
UL https://suche.suub.uni-bremen.de/peid=acm-3194563&Exemplar=1&LAN=DE A1 Ahmadi Balef, Hadi A1 Fatemi, Hamed A1 Goossens, Kees A1 Pineda de Gyvez, José PB ACM YR 2018 K1 cmos variability K1 digital circuit K1 in-situ delay monitoring K1 reliability K1 Computer systems organization K1 Dependable and fault-tolerant systems and networks K1 Reliability K1 Hardware K1 Integrated circuits K1 Logic circuits K1 Sequential circuits K1 Very large scale integration design K1 Application-specific VLSI designs K1 Application specific integrated circuits K1 On-chip sensors K1 Robustness K1 Fault tolerance K1 Error detection and error correction K1 Failure prediction K1 Electronic design automation K1 Timing analysis K1 Static timing analysis K1 Hardware reliability K1 Aging of circuits and systems K1 Process, voltage and temperature variations K1 Safety critical systems SP 213 OP 218 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3194554.3194563 DO https://dl.acm.org/doi/10.1145/3194554.3194563 SF ELIB - SuUB Bremen
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