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SARO : A State-Aware Reliability Optimization Technique ..:
, In:
Proceedings of the 2018 Great Lakes Symposium on VLSI
,
Kim, Myungsuk
;
Song, Youngsun
;
Jung, Myoungsoo
. - p. 255-260 , 2018
Link:
https://dl.acm.org/doi/10.1145/3194554.3194591
RT T1 <cTitle>Proceedings of the 2018 Great Lakes Symposium on VLSI</cTitle>: T1 <Title>SARO : A State-Aware Reliability Optimization Technique for High Density NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3194591&Exemplar=1&LAN=DE A1 Kim, Myungsuk A1 Song, Youngsun A1 Jung, Myoungsoo A1 Kim, Jihong PB ACM YR 2018 K1 ispp management K1 nand flash memory K1 nand flash performance K1 nand flash reliability optimization K1 nand flash retention K1 Computer systems organization K1 Embedded and cyber-physical systems K1 Embedded systems K1 Hardware K1 Integrated circuits K1 Semiconductor memory K1 Non-volatile memory K1 Emerging technologies K1 Analysis and design of emerging devices and systems SP 255 OP 260 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3194554.3194591 DO https://dl.acm.org/doi/10.1145/3194554.3194591 SF ELIB - SuUB Bremen
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