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1 Ergebnisse
1
An efficient Bayesian yield estimation method for high dime..:
, In:
Proceedings of the 55th Annual Design Automation Conference
,
Zhai, Jinyuan
;
Yan, Changhao
;
Wang, Sheng-Guo
. - p. 1-6 , 2018
Link:
https://dl.acm.org/doi/10.1145/3195970.3195987
RT T1 <cTitle>Proceedings of the 55th Annual Design Automation Conference</cTitle>: T1 <Title>An efficient Bayesian yield estimation method for high dimensional and high sigma SRAM circuits</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3195987&Exemplar=1&LAN=DE A1 Zhai, Jinyuan A1 Yan, Changhao A1 Wang, Sheng-Guo A1 Zhou, Dian PB ACM YR 2018 SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3195970.3195987 DO https://dl.acm.org/doi/10.1145/3195970.3195987 SF ELIB - SuUB Bremen
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