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Fast physics-based electromigration assessment by efficient..:

, In: Proceedings of the 36th International Conference on Computer-Aided Design,
Chatterjee, Sandeep ; Sukharev, Valeriy ; Najm, Farid N. - p. 659-666 , 2017
Link: https://dl.acm.org/doi/10.5555/3199700.3199788