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Session details: Session 10D: digital and analog test gener..:
, In:
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
,
Vinnakota, Bapiraju
;
Kajihara, Seiji
, 2000
Link:
https://dl.acm.org/doi/10.5555/602902.3248363
RT T1 <cTitle>Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design</cTitle>: T1 <Title>Session details: Session 10D: digital and analog test generation</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3248363&Exemplar=1&LAN=DE A1 Vinnakota, Bapiraju A1 Kajihara, Seiji PB IEEE Press YR 2000 K1 Hardware K1 Robustness LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/602902.3248363 DO https://dl.acm.org/doi/10.5555/602902.3248363 SF ELIB - SuUB Bremen
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