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Session details: Dealing with manufacturing and reliability..:
, In:
Proceedings of the International Conference on Computer-Aided Design
,
Pan, David Z.
;
Sapatnekar, Sachin
, 2012
Link:
https://dl.acm.org/doi/10.1145/3260344
RT T1 <cTitle>Proceedings of the International Conference on Computer-Aided Design</cTitle>: T1 <Title>Session details: Dealing with manufacturing and reliability in extremely scaled CMOS and beyond</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3260344&Exemplar=1&LAN=DE A1 Pan, David Z. A1 Sapatnekar, Sachin PB ACM YR 2012 K1 Applied computing K1 Enterprise computing K1 Hardware K1 Integrated circuits K1 Very large scale integration design K1 Operations research K1 Computer-aided manufacturing LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3260344 DO https://dl.acm.org/doi/10.1145/3260344 SF ELIB - SuUB Bremen
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