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1 Ergebnisse
1
Fast snapshot migration using static code instrumentation ..:
, In:
Proceedings of the International Conference on Embedded Software
,
Kim, Jae-Yun
;
Lee, Hyeon-Jae
;
Moon, Soo-Mook
- p. 1-2 , 2018
Link:
https://dl.acm.org/doi/10.5555/3283535.3283540
RT T1 <cTitle>Proceedings of the International Conference on Embedded Software</cTitle>: T1 <Title>Fast snapshot migration using static code instrumentation : work-in-progress</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3283540&Exemplar=1&LAN=DE A1 Kim, Jae-Yun A1 Lee, Hyeon-Jae A1 Moon, Soo-Mook PB IEEE Press YR 2018 K1 app migration K1 code instrumentation K1 snapshot SP 1 OP 2 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/3283535.3283540 DO https://dl.acm.org/doi/10.5555/3283535.3283540 SF ELIB - SuUB Bremen
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