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1 Ergebnisse
1
Reliability Evaluation with Heat Dissipation Effect for a K..:
, In:
Proceedings of the 2nd International Conference on Telecommunications and Communication Engineering
,
Lin, Qian
;
Wu, Hai-Feng
;
Pan, Ying
. - p. 180-184 , 2018
Link:
https://dl.acm.org/doi/10.1145/3291842.3291874
RT T1
Proceedings of the 2nd International Conference on Telecommunications and Communication Engineering
: T1
Reliability Evaluation with Heat Dissipation Effect for a Ka-band MMIC PA
UL https://suche.suub.uni-bremen.de/peid=acm-3291874&Exemplar=1&LAN=DE A1 Lin, Qian A1 Wu, Hai-Feng A1 Pan, Ying A1 Liu, Lin-sheng PB ACM YR 2018 K1 Atomic Flux Divergence (AFD) K1 Finite Element Analysis (FEA) K1 Heat Dissipation K1 MMIC Power Amplifier (MMIC PA) K1 Reliability Evaluation K1 Hardware K1 Integrated circuits K1 Interconnect K1 Radio frequency and wireless interconnect SP 180 OP 184 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3291842.3291874 DO https://dl.acm.org/doi/10.1145/3291842.3291874 SF ELIB - SuUB Bremen
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