I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Visualizing Test-Defect Coverage Information to Support Ana..:
, In:
Proceedings of the 2019 8th International Conference on Software and Computer Applications
,
Syed-Mohamad, Sharifah Mashita
;
Husin, Mohd Heikal
;
Zainon, Wan Mohd Nazmee Wan
- p. 184-188 , 2019
Link:
https://dl.acm.org/doi/10.1145/3316615.3316666
RT T1
Proceedings of the 2019 8th International Conference on Software and Computer Applications
: T1
Visualizing Test-Defect Coverage Information to Support Analytical Reasoning and Testing
UL https://suche.suub.uni-bremen.de/peid=acm-3316666&Exemplar=1&LAN=DE A1 Syed-Mohamad, Sharifah Mashita A1 Husin, Mohd Heikal A1 Zainon, Wan Mohd Nazmee Wan PB ACM YR 2019 K1 Software Reliability K1 Software Testing K1 Software Visualization K1 Test Analytics K1 Visual Analytics K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 184 OP 188 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3316615.3316666 DO https://dl.acm.org/doi/10.1145/3316615.3316666 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)