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A comparison of two embedded systems to detect electrical d..:

, In: Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design,
Santos, Reneilson ; Moreno, Edward David ; Estombelo-Montesco, Carlos - p. 1-6 , 2019
Link: https://dl.acm.org/doi/10.1145/3338852.3339878