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1 Ergebnisse
1
Conventional and deep feature oriented quality inspection o..:
, In:
Proceedings of the 6th International Conference on Networking, Systems and Security
,
Roy, Sourav Dey
;
Das, Dipak Hrishi
;
Bhowmik, Mrinal Kanti
- p. 12-20 , 2019
Link:
https://dl.acm.org/doi/10.1145/3362966.3362969
RT T1
Proceedings of the 6th International Conference on Networking, Systems and Security
: T1
Conventional and deep feature oriented quality inspection of internal defected eggs using infrared imaging
UL https://suche.suub.uni-bremen.de/peid=acm-3362969&Exemplar=1&LAN=DE A1 Roy, Sourav Dey A1 Das, Dipak Hrishi A1 Bhowmik, Mrinal Kanti PB ACM YR 2019 K1 asymmetric analysis K1 classification K1 defect K1 egg K1 feature extraction K1 feature selection K1 infrared imaging K1 Computing methodologies K1 Machine learning K1 Machine learning algorithms K1 Feature selection SP 12 OP 20 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3362966.3362969 DO https://dl.acm.org/doi/10.1145/3362966.3362969 SF ELIB - SuUB Bremen
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