I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Conventional and deep feature oriented quality inspection o..:
, In:
Proceedings of the 6th International Conference on Networking, Systems and Security
,
Roy, Sourav Dey
;
Das, Dipak Hrishi
;
Bhowmik, Mrinal Kanti
- p. 12-20 , 2019
Link:
https://dl.acm.org/doi/10.1145/3362966.3362969
RT T1 <cTitle>Proceedings of the 6th International Conference on Networking, Systems and Security</cTitle>: T1 <Title>Conventional and deep feature oriented quality inspection of internal defected eggs using infrared imaging</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3362969&Exemplar=1&LAN=DE A1 Roy, Sourav Dey A1 Das, Dipak Hrishi A1 Bhowmik, Mrinal Kanti PB ACM YR 2019 K1 asymmetric analysis K1 classification K1 defect K1 egg K1 feature extraction K1 feature selection K1 infrared imaging K1 Computing methodologies K1 Machine learning K1 Machine learning algorithms K1 Feature selection SP 12 OP 20 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3362966.3362969 DO https://dl.acm.org/doi/10.1145/3362966.3362969 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
