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1 Ergebnisse
1
Software visualization and deep transfer learning for effec..:
, In:
Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering
,
Chen, Jinyin
;
Hu, Keke
;
Yu, Yue
... - p. 578-589 , 2020
Link:
https://dl.acm.org/doi/10.1145/3377811.3380389
RT T1 <cTitle>Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering</cTitle>: T1 <Title>Software visualization and deep transfer learning for effective software defect prediction</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3380389&Exemplar=1&LAN=DE A1 Chen, Jinyin A1 Hu, Keke A1 Yu, Yue A1 Chen, Zhuangzhi A1 Xuan, Qi A1 Liu, Yi A1 Filkov, Vladimir PB ACM YR 2020 K1 cross-project defect prediction K1 deep transfer learning K1 self-attention K1 software visualization K1 within-project defect prediction SP 578 OP 589 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3377811.3380389 DO https://dl.acm.org/doi/10.1145/3377811.3380389 SF ELIB - SuUB Bremen
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