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MAP-Coverage : a novel coverage criterion for testing th..:

, In: Proceedings of the 34th IEEE/ACM International Conference on Automated Software Engineering,
Wang, Zan ; Zhao, Yingquan ; Liu, Shuang... - p. 722-734 , 2019
Link: https://dl.acm.org/doi/10.1109/ASE.2019.00073