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1 Ergebnisse
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Machine Learning Approach for Fast Electromigration Aware A..:
Dey, Sukanta
;
Nandi, Sukumar
;
Trivedi, Gaurav
ACM Transactions on Design Automation of Electronic Systems (TODAES). 25 (2020) 5 - p. 1-29 , 2020
Link:
https://dl.acm.org/doi/10.1145/3399677
RT Journal T1
Machine Learning Approach for Fast Electromigration Aware Aging Prediction in Incremental Design of Large Scale On-chip Power Grid Network
UL https://suche.suub.uni-bremen.de/peid=acm-3399677&Exemplar=1&LAN=DE A1 Dey, Sukanta A1 Nandi, Sukumar A1 Trivedi, Gaurav PB ACM YR 2020 SN 1084-4309 SN 1557-7309 K1 Electromigration K1 MTTF K1 machine learning K1 neural network K1 power grid network K1 regression K1 reliability K1 Hardware K1 Very large scale integration design K1 VLSI packaging K1 Package-level interconnect K1 Electronic design automation K1 Physical design (EDA) K1 Power grid design K1 Robustness K1 Hardware reliability K1 Aging of circuits and systems K1 Computing methodologies K1 Machine learning K1 Machine learning approaches K1 Classification and regression trees K1 Economics of chip design and manufacturing K1 Neural networks K1 Fault tolerance K1 Failure prediction JF ACM Transactions on Design Automation of Electronic Systems (TODAES) VO 25 IS 5 SP 1 OP 29 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3399677 DO https://dl.acm.org/doi/10.1145/3399677 SF ELIB - SuUB Bremen
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