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1 Ergebnisse
1
BeLDPC : bit errors aware adaptive rate LDPC codes for 3..:
, In:
Proceedings of the 23rd Conference on Design, Automation and Test in Europe
,
Zhang, Meng
;
Wu, Fei
;
Yu, Qin
... - p. 302-305 , 2020
Link:
https://dl.acm.org/doi/10.5555/3408352.3408421
RT T1 <cTitle>Proceedings of the 23rd Conference on Design, Automation and Test in Europe</cTitle>: T1 <Title>BeLDPC : bit errors aware adaptive rate LDPC codes for 3D TLC NAND flash memory</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3408421&Exemplar=1&LAN=DE A1 Zhang, Meng A1 Wu, Fei A1 Yu, Qin A1 Liu, Weihua A1 Cui, Lanlan A1 Zhao, Yahui A1 Xie, Changsheng PB EDA Consortium YR 2020 SP 302 OP 305 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/3408352.3408421 DO https://dl.acm.org/doi/10.5555/3408352.3408421 SF ELIB - SuUB Bremen
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