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1 Ergebnisse
1
RESCUE : interdependent challenges of reliability, secur..:
, In:
Proceedings of the 23rd Conference on Design, Automation and Test in Europe
,
Jenihhin, M.
;
Hamdioui, S.
;
Reorda, M. Sonza
... - p. 388-393 , 2020
Link:
https://dl.acm.org/doi/10.5555/3408352.3408442
RT T1 <cTitle>Proceedings of the 23rd Conference on Design, Automation and Test in Europe</cTitle>: T1 <Title>RESCUE : interdependent challenges of reliability, security and quality in nanoelectronic systems</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3408442&Exemplar=1&LAN=DE A1 Jenihhin, M. A1 Hamdioui, S. A1 Reorda, M. Sonza A1 Krstic, M. A1 Langendörfer, P. A1 Sauer, C. A1 Klotz, A. A1 Huebner, M. A1 Nolte, J. A1 Vierhaus, H. T. A1 Selimis, G. A1 Alexandrescu, D. A1 Taouil, M. A1 Schrijen, G. J. A1 Raik, J. A1 Sterpone, L. A1 Squillero, G. A1 Dyka, Z. PB EDA Consortium YR 2020 K1 EDA tools K1 fault tolerance K1 reliability K1 security K1 test SP 388 OP 393 LK http://dx.doi.org/https://dl.acm.org/doi/10.5555/3408352.3408442 DO https://dl.acm.org/doi/10.5555/3408352.3408442 SF ELIB - SuUB Bremen
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