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A DFT scheme to improve coverage of hard-to-detect faults i..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Medeiros, Guilherme Cardoso ; Gürsoy, Cemil Cem ; Wu, Lizhou... - p. 792-797 , 2020
Link: https://dl.acm.org/doi/10.5555/3408352.3408533