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GraphRSim : a joint device-algorithm reliability analysi..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Nien, Chin-Fu ; Hsiao, Yi-Jou ; Cheng, Hsiang-Yun... - p. 1478-1483 , 2020
Link: https://dl.acm.org/doi/10.5555/3408352.3408688