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1 Ergebnisse
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JITO: a tool for just-in-time defect identification and loc..:
, In:
Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering
,
Qiu, Fangcheng
;
Yan, Meng
;
Xia, Xin
... - p. 1586-1590 , 2020
Link:
https://dl.acm.org/doi/10.1145/3368089.3417927
RT T1 <cTitle>Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering</cTitle>: T1 <Title>JITO: a tool for just-in-time defect identification and localization</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3417927&Exemplar=1&LAN=DE A1 Qiu, Fangcheng A1 Yan, Meng A1 Xia, Xin A1 Wang, Xinyu A1 Fan, Yuanrui A1 Hassan, Ahmed E. A1 Lo, David PB ACM YR 2020 K1 Defect Identification K1 Defect Localization K1 Just-in-Time K1 Software Naturalness K1 Computer systems organization K1 Embedded and cyber-physical systems K1 Embedded systems SP 1586 OP 1590 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3368089.3417927 DO https://dl.acm.org/doi/10.1145/3368089.3417927 SF ELIB - SuUB Bremen
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