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Challenges & opportunities in low-code testing:

, In: Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems: Companion Proceedings,
Khorram, Faezeh ; Mottu, Jean-Marie ; Sunyé, Gerson - p. 1-10 , 2020
Link: https://dl.acm.org/doi/10.1145/3417990.3420204