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Realistic fault models and fault simulation for quantum dot..:

, In: Proceedings of the 57th ACM/EDAC/IEEE Design Automation Conference,
Hsieh, Cheng-Yun ; Wu, Chen-Hung ; Huang, Chia-Hsien.. - p. 1-6 , 2020
Link: https://dl.acm.org/doi/10.5555/3437539.3437585