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1 Ergebnisse
1
Parametric fault simulation and test vector generation:
, In:
Proceedings of the conference on Design, automation and test in Europe
,
Saab, Khaled
;
Ben-Hamida, Naim
;
Kaminska, Bozena
- p. 650-657 , 2000
Link:
https://dl.acm.org/doi/10.1145/343647.343883
RT T1 <cTitle>Proceedings of the conference on Design, automation and test in Europe</cTitle>: T1 <Title>Parametric fault simulation and test vector generation</Title> UL https://suche.suub.uni-bremen.de/peid=acm-343883&Exemplar=1&LAN=DE A1 Saab, Khaled A1 Ben-Hamida, Naim A1 Kaminska, Bozena PB ACM YR 2000 K1 Hardware K1 Hardware validation K1 Hardware test K1 Robustness K1 Hardware reliability SP 650 OP 657 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/343647.343883 DO https://dl.acm.org/doi/10.1145/343647.343883 SF ELIB - SuUB Bremen
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