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Reunion Block for High Magnification Histopathology Microsc..:

, In: Proceedings of the 2020 ACM International Conference on Intelligent Computing and its Emerging Applications,
Park, Hyun-Cheol ; Lee, Sang-Woong - p. 1-2 , 2020
Link: https://dl.acm.org/doi/10.1145/3440943.3444356