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1 Ergebnisse
1
Looking for Trouble: Analyzing Classifier Behavior via Patt..:
, In:
Proceedings of the 2021 International Conference on Management of Data
,
Pastor, Eliana
;
de Alfaro, Luca
;
Baralis, Elena
- p. 1400-1412 , 2021
Link:
https://dl.acm.org/doi/10.1145/3448016.3457284
RT T1 <cTitle>Proceedings of the 2021 International Conference on Management of Data</cTitle>: T1 <Title>Looking for Trouble: Analyzing Classifier Behavior via Pattern Divergence</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3457284&Exemplar=1&LAN=DE A1 Pastor, Eliana A1 de Alfaro, Luca A1 Baralis, Elena PB ACM YR 2021 K1 bias detection K1 classifier validation K1 fairness in machine learning K1 machine-learning model debugging K1 shapley value K1 Mathematics of computing K1 Probability and statistics K1 Statistical paradigms K1 Exploratory data analysis K1 Information systems K1 Information systems applications K1 Data mining SP 1400 OP 1412 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3448016.3457284 DO https://dl.acm.org/doi/10.1145/3448016.3457284 SF ELIB - SuUB Bremen
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