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An In-depth Analysis on the Use of Long Short-term Memory N..:

, In: 2021 International Symposium on Electrical, Electronics and Information Engineering,
Lobato Barreira, Bruna ; Fray da Silva, Roberto ; Eduardo Cugnasca, Carlos - p. 384-390 , 2021
Link: https://dl.acm.org/doi/10.1145/3459104.3459167