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1 Ergebnisse
1
Tuning Memory Fault Tolerance on the Edge:
, In:
Proceedings of the 2021 on Great Lakes Symposium on VLSI
,
Jones, Alex K.
;
Longofono, Stephen
;
Ollivier, Sebastien
... - p. 421-424 , 2021
Link:
https://dl.acm.org/doi/10.1145/3453688.3462231
RT T1 <cTitle>Proceedings of the 2021 on Great Lakes Symposium on VLSI</cTitle>: T1 <Title>Tuning Memory Fault Tolerance on the Edge</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3462231&Exemplar=1&LAN=DE A1 Jones, Alex K. A1 Longofono, Stephen A1 Ollivier, Sebastien A1 Kline, Donald A1 Zhang, Jiangwei A1 Melhem, Rami PB ACM YR 2021 K1 deep scaling K1 emerging memory endurance K1 fault tolerance K1 process variation K1 Hardware K1 Robustness K1 Fault tolerance K1 Error detection and error correction K1 Integrated circuits K1 Semiconductor memory K1 Non-volatile memory K1 Emerging technologies K1 Memory and dense storage K1 Analysis and design of emerging devices and systems K1 Emerging architectures K1 Hardware reliability K1 Aging of circuits and systems K1 System-level fault tolerance SP 421 OP 424 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3453688.3462231 DO https://dl.acm.org/doi/10.1145/3453688.3462231 SF ELIB - SuUB Bremen
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