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1
Exposing previously undetectable faults in deep neural netw..:
, In:
Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis
,
Dunn, Isaac
;
Pouget, Hadrien
;
Kroening, Daniel
. - p. 56-66 , 2021
Link:
https://dl.acm.org/doi/10.1145/3460319.3464801
RT T1 <cTitle>Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis</cTitle>: T1 <Title>Exposing previously undetectable faults in deep neural networks</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3464801&Exemplar=1&LAN=DE A1 Dunn, Isaac A1 Pouget, Hadrien A1 Kroening, Daniel A1 Melham, Tom PB ACM YR 2021 K1 Deep Learning K1 Generative Adversarial Networks K1 Robustness K1 Computing methodologies K1 Machine learning K1 Machine learning approaches K1 Neural networks K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 56 OP 66 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3460319.3464801 DO https://dl.acm.org/doi/10.1145/3460319.3464801 SF ELIB - SuUB Bremen
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