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1 Ergebnisse
1
Toward optimal mc/dc test case generation:
, In:
Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis
,
Godboley, Sangharatna
;
Jaffar, Joxan
;
Maghareh, Rasool
. - p. 505-516 , 2021
Link:
https://dl.acm.org/doi/10.1145/3460319.3464841
RT T1 <cTitle>Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis</cTitle>: T1 <Title>Toward optimal mc/dc test case generation</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3464841&Exemplar=1&LAN=DE A1 Godboley, Sangharatna A1 Jaffar, Joxan A1 Maghareh, Rasool A1 Dutta, Arpita PB ACM YR 2021 K1 MC/DC Testing K1 Software Testing K1 Symbolic Execution K1 Software and its engineering K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 505 OP 516 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3460319.3464841 DO https://dl.acm.org/doi/10.1145/3460319.3464841 SF ELIB - SuUB Bremen
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