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Reducing the search space of bug inducing commits using fai..:
, In:
Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering
,
An, Gabin
;
Yoo, Shin
- p. 1459-1462 , 2021
Link:
https://dl.acm.org/doi/10.1145/3468264.3473129
RT T1 <cTitle>Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering</cTitle>: T1 <Title>Reducing the search space of bug inducing commits using failure coverage</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3473129&Exemplar=1&LAN=DE A1 An, Gabin A1 Yoo, Shin PB ACM YR 2021 K1 bug inducing commit K1 test coverage K1 Software and its engineering K1 Software creation and management K1 Software post-development issues K1 Maintaining software SP 1459 OP 1462 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3468264.3473129 DO https://dl.acm.org/doi/10.1145/3468264.3473129 SF ELIB - SuUB Bremen
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