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1 Ergebnisse
1
Tolerating Defects in Low-Power Neural Network Accelerators..:
Hosseini, Fateme S.
;
Meng, Fanruo
;
Yang, Chengmo
..
ACM Transactions on Embedded Computing Systems (TECS). 20 (2021) 5s - p. 1-21 , 2021
Link:
https://dl.acm.org/doi/10.1145/3477016
RT Journal T1
Tolerating Defects in Low-Power Neural Network Accelerators Via Retraining-Free Weight Approximation
UL https://suche.suub.uni-bremen.de/peid=acm-3477016&Exemplar=1&LAN=DE A1 Hosseini, Fateme S. A1 Meng, Fanruo A1 Yang, Chengmo A1 Wen, Wujie A1 Cammarota, Rosario PB ACM YR 2021 SN 1539-9087 SN 1558-3465 K1 Neural network accelerator K1 defect tolerance K1 reliability K1 memory faults K1 approximation K1 Computer systems organization K1 Reliability K1 Neural networks K1 Embedded software K1 Hardware K1 Error detection and error correction JF ACM Transactions on Embedded Computing Systems (TECS) VO 20 IS 5s SP 1 OP 21 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3477016 DO https://dl.acm.org/doi/10.1145/3477016 SF ELIB - SuUB Bremen
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