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FILL and FUNI : algorithms to identify illegal states an..:

Long, David E. ; Iyer, Mahesh A. ; Abramovici, Miron
ACM Transactions on Design Automation of Electronic Systems (TODAES). 5 (2000) 3 - p. 631-657 , 2000

Link: https://dl.acm.org/doi/10.1145/348019.348311

RT Journal
T1 <Title>FILL and FUNI				: algorithms to identify illegal states and sequentially untestable faults</Title>

UL https://suche.suub.uni-bremen.de/peid=acm-348311&Exemplar=1&LAN=DE
				
A1 Long, David E.
A1 Iyer, Mahesh A.
A1 Abramovici, Miron
PB ACM
YR 2000
SN 1084-4309
SN 1557-7309
K1 automatic test generation
K1 illegal states
K1 sequential circuits
K1 untestable faults
K1 Hardware
K1 Integrated circuits
K1 Logic circuits
K1 Sequential circuits
K1 Applied computing
K1 Arts and humanities
K1 Architecture (buildings)
K1 Computer-aided design
K1 Physical sciences and engineering
K1 Engineering
K1 Electronics
K1 Hardware validation
K1 Arithmetic and datapath circuits
K1 Robustness
K1 Very large scale integration design
K1 Functional verification
K1 Digital switches
K1 Logic families
K1 Simulation and emulation
K1 Hardware test
JF ACM Transactions on Design Automation of Electronic Systems (TODAES)
VO 5
IS 3
SP 631
OP 657
LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/348019.348311
DO https://dl.acm.org/doi/10.1145/348019.348311
SF ELIB - SuUB Bremen

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