I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Distribution-Aware Testing of Neural Networks Using Generat..:
, In:
Proceedings of the 43rd International Conference on Software Engineering
,
Dola, Swaroopa
;
Dwyer, Matthew B.
;
Soffa, Mary Lou
- p. 226-237 , 2021
Link:
https://dl.acm.org/doi/10.1109/ICSE43902.2021.00032
RT T1
Proceedings of the 43rd International Conference on Software Engineering
: T1
Distribution-Aware Testing of Neural Networks Using Generative Models
UL https://suche.suub.uni-bremen.de/peid=acm-3498127&Exemplar=1&LAN=DE A1 Dola, Swaroopa A1 Dwyer, Matthew B. A1 Soffa, Mary Lou PB IEEE Press YR 2021 K1 deep learning K1 deep neural networks K1 input validation K1 test coverage K1 test generation K1 Computing methodologies K1 Software and its engineering K1 Machine learning K1 Software organization and properties K1 Software creation and management K1 Machine learning approaches K1 Software verification and validation K1 Neural networks K1 Software defect analysis K1 Software testing and debugging SP 226 OP 237 LK http://dx.doi.org/https://dl.acm.org/doi/10.1109/ICSE43902.2021.00032 DO https://dl.acm.org/doi/10.1109/ICSE43902.2021.00032 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)