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1 Ergebnisse
1
flack : Counterexample-Guided Fault Localization for All..:
, In:
Proceedings of the 43rd International Conference on Software Engineering
,
Zheng, Guolong
;
Nguyen, ThanhVu
;
Brida, Simón Gutiérrez
... - p. 637-648 , 2021
Link:
https://dl.acm.org/doi/10.1109/ICSE43902.2021.00065
RT T1 <cTitle>Proceedings of the 43rd International Conference on Software Engineering</cTitle>: T1 <Title>flack : Counterexample-Guided Fault Localization for Alloy Models</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3498178&Exemplar=1&LAN=DE A1 Zheng, Guolong A1 Nguyen, ThanhVu A1 Brida, Simón Gutiérrez A1 Regis, Germán A1 Frias, Marcelo F. A1 Aguirre, Nazareno A1 Bagheri, Hamid PB IEEE Press YR 2021 K1 Software and its engineering K1 Software creation and management K1 Software development process management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging SP 637 OP 648 LK http://dx.doi.org/https://dl.acm.org/doi/10.1109/ICSE43902.2021.00065 DO https://dl.acm.org/doi/10.1109/ICSE43902.2021.00065 SF ELIB - SuUB Bremen
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