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Artifact of 'FLACK: counterexample-guided fault localizatio..:
, In:
Proceedings of the 43rd International Conference on Software Engineering: Companion Proceedings
,
Zheng, Guolong
;
Nguyen, ThanhVu
;
Brida, Simón Gutiérrez
... - p. 179-180 , 2021
Link:
https://dl.acm.org/doi/10.1109/ICSE-Companion52605.202..
RT T1 <cTitle>Proceedings of the 43rd International Conference on Software Engineering: Companion Proceedings</cTitle>: T1 <Title>Artifact of 'FLACK: counterexample-guided fault localization for alloy models'</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3502972&Exemplar=1&LAN=DE A1 Zheng, Guolong A1 Nguyen, ThanhVu A1 Brida, Simón Gutiérrez A1 Regis, Germán A1 Frias, Marcelo F. A1 Aguirre, Nazareno A1 Bagheri, Hamid PB IEEE Press YR 2021 K1 alloy K1 fault localization SP 179 OP 180 LK http://dx.doi.org/https://dl.acm.org/doi/10.1109/ICSE-Companion52605.2021.00077 DO https://dl.acm.org/doi/10.1109/ICSE-Companion52605.2021.00077 SF ELIB - SuUB Bremen
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