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On built-in test reuse in object-oriented framework design:
Wang, Yingwu
;
Patel, Dilip
;
King, Graham
...
ACM Computing Surveys (CSUR). 32 (2000) 1es - p. 7-es , 2000
Link:
https://dl.acm.org/doi/10.1145/351936.351943
RT Journal T1
On built-in test reuse in object-oriented framework design
UL https://suche.suub.uni-bremen.de/peid=acm-351943&Exemplar=1&LAN=DE A1 Wang, Yingwu A1 Patel, Dilip A1 King, Graham A1 Court, Ian A1 Staples, Geoff A1 Ross, Maraget A1 Fayad, Mohamad PB ACM YR 2000 SN 0360-0300 SN 1557-7341 K1 built-in test K1 code reuse K1 frameowrk K1 framework reuse K1 object-oriented technology K1 pattern K1 software engineering K1 test reuse K1 testable software K1 Software and its engineering K1 Software notations and tools K1 General programming languages K1 Language features K1 Frameworks K1 Language types K1 Object oriented languages K1 Software creation and management K1 Software verification and validation K1 Software defect analysis K1 Software testing and debugging JF ACM Computing Surveys (CSUR) VO 32 IS 1es SP 7 OP es LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/351936.351943 DO https://dl.acm.org/doi/10.1145/351936.351943 SF ELIB - SuUB Bremen
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