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What do developer-repaired Flaky tests tell us about the ef..:

, In: Proceedings of the 3rd ACM/IEEE International Conference on Automation of Software Test,
Parry, Owain ; Kapfhammer, Gregory M. ; Hilton, Michael. - p. 160-164 , 2022
Link: https://dl.acm.org/doi/10.1145/3524481.3527227