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The Spotlight: A General Method for Discovering Systematic ..:
, In:
2022 ACM Conference on Fairness, Accountability, and Transparency
,
d'Eon, Greg
;
d'Eon, Jason
;
Wright, James R.
. - p. 1962-1981 , 2022
Link:
https://dl.acm.org/doi/10.1145/3531146.3533240
RT T1 <cTitle>2022 ACM Conference on Fairness, Accountability, and Transparency</cTitle>: T1 <Title>The Spotlight: A General Method for Discovering Systematic Errors in Deep Learning Models</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3533240&Exemplar=1&LAN=DE A1 d'Eon, Greg A1 d'Eon, Jason A1 Wright, James R. A1 Leyton-Brown, Kevin PB ACM YR 2022 K1 auditing K1 deep learning K1 distributional robustness K1 fairness K1 Computing methodologies K1 Machine learning SP 1962 OP 1981 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3531146.3533240 DO https://dl.acm.org/doi/10.1145/3531146.3533240 SF ELIB - SuUB Bremen
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