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Automatic Test Configuration and Pattern Generation (ATCPG)..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
Chiu, I-Wei ; Chen, Xin-Ping ; Hu, Jennifer Shueh-Inn. - p. 1-7 , 2022
Link: https://dl.acm.org/doi/10.1145/3508352.3549422