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Testing of machine learning models with limited samples: an..:
, In:
Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering
,
Chatterjee, Ayan
;
Ahmed, Bestoun S.
;
Hallin, Erik
. - p. 1280-1290 , 2022
Link:
https://dl.acm.org/doi/10.1145/3540250.3558943
RT T1 <cTitle>Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering</cTitle>: T1 <Title>Testing of machine learning models with limited samples: an industrial vacuum pumping application</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3558943&Exemplar=1&LAN=DE A1 Chatterjee, Ayan A1 Ahmed, Bestoun S. A1 Hallin, Erik A1 Engman, Anton PB ACM YR 2022 K1 data augmentation K1 data decomposition K1 machine learning K1 mlops K1 software testing K1 vacuum pumping K1 Software and its engineering K1 Software testing and debugging SP 1280 OP 1290 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3540250.3558943 DO https://dl.acm.org/doi/10.1145/3540250.3558943 SF ELIB - SuUB Bremen
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