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1 Ergebnisse
1
Machine Learning for Testing Machine-Learning Hardware :..:
, In:
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design
,
Chaudhuri, Arjun
;
Talukdar, Jonti
;
Chakrabarty, Krishnendu
- p. 1-6 , 2022
Link:
https://dl.acm.org/doi/10.1145/3508352.3561121
RT T1
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design
: T1
Machine Learning for Testing Machine-Learning Hardware : A Virtuous Cycle
UL https://suche.suub.uni-bremen.de/peid=acm-3561121&Exemplar=1&LAN=DE A1 Chaudhuri, Arjun A1 Talukdar, Jonti A1 Chakrabarty, Krishnendu PB ACM YR 2022 K1 Computing methodologies K1 Computer systems organization K1 Hardware K1 Machine learning K1 Architectures K1 Hardware test K1 Emerging technologies K1 Machine learning approaches K1 Other architectures K1 Neural networks SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3508352.3561121 DO https://dl.acm.org/doi/10.1145/3508352.3561121 SF ELIB - SuUB Bremen
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