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Session details: Analyzing Reliability, Defects and Pattern..:
, In:
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design
,
Reddy, Gaurav Rajavendra
;
Adam, Kostas
, 2022
Link:
https://dl.acm.org/doi/10.1145/3578433
RT T1 <cTitle>Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design</cTitle>: T1 <Title>Session details: Analyzing Reliability, Defects and Patterning</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3578433&Exemplar=1&LAN=DE A1 Reddy, Gaurav Rajavendra A1 Adam, Kostas PB ACM YR 2022 K1 Applied computing K1 Hardware K1 Physical sciences and engineering K1 Hardware test K1 Robustness K1 Emerging technologies K1 Hardware validation K1 Functional verification K1 Hardware reliability LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3578433 DO https://dl.acm.org/doi/10.1145/3578433 SF ELIB - SuUB Bremen
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