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1 Ergebnisse
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Wave-iPCRNet: Toward point cloud registration in electronic..:
, In:
Proceedings of the 2022 5th International Conference on Algorithms, Computing and Artificial Intelligence
,
Zhong, Quan
;
Dai, Hua-Feng
;
Shao, Jun
... - p. 1-6 , 2022
Link:
https://dl.acm.org/doi/10.1145/3579654.3579703
RT T1 <cTitle>Proceedings of the 2022 5th International Conference on Algorithms, Computing and Artificial Intelligence</cTitle>: T1 <Title>Wave-iPCRNet: Toward point cloud registration in electronics manufacturing by a quantum-inspired iterative point cloud registration network</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3579703&Exemplar=1&LAN=DE A1 Zhong, Quan A1 Dai, Hua-Feng A1 Shao, Jun A1 Wang, Jyun-Rong A1 Chen, Tao-Gen A1 Liu, Hao PB ACM YR 2022 K1 Defect detection in electronics manufacturing K1 PointNet K1 Wave-MLP K1 WaveBlock K1 point cloud K1 point cloud registration K1 Computing methodologies K1 Artificial intelligence K1 Machine learning K1 Computer vision K1 Machine learning approaches K1 Neural networks SP 1 OP 6 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3579654.3579703 DO https://dl.acm.org/doi/10.1145/3579654.3579703 SF ELIB - SuUB Bremen
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