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1 Ergebnisse
1
FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Patt..:
, In:
Proceedings of the Great Lakes Symposium on VLSI 2023
,
Ye, Yuyang
;
Wang, Zonghui
;
Xue, Zun
... - p. 299-304 , 2023
Link:
https://dl.acm.org/doi/10.1145/3583781.3590250
RT T1 <cTitle>Proceedings of the Great Lakes Symposium on VLSI 2023</cTitle>: T1 <Title>FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3590250&Exemplar=1&LAN=DE A1 Ye, Yuyang A1 Wang, Zonghui A1 Xue, Zun A1 Wang, Ziqi A1 Gao, Yifei A1 Yan, Hao PB ACM YR 2023 K1 atpg K1 graph learning K1 parallel technology K1 Hardware K1 Hardware test K1 Testing with distributed and parallel systems K1 Test-pattern generation and fault simulation SP 299 OP 304 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3583781.3590250 DO https://dl.acm.org/doi/10.1145/3583781.3590250 SF ELIB - SuUB Bremen
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