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1 Ergebnisse
1
Two Highly Reliable and High-Speed SRAM Cells for Safety-Cr..:
, In:
Proceedings of the Great Lakes Symposium on VLSI 2023
,
Yan, Aibin
;
Chang, Yang
;
Xiang, Jing
... - p. 293-298 , 2023
Link:
https://dl.acm.org/doi/10.1145/3583781.3590261
RT T1 <cTitle>Proceedings of the Great Lakes Symposium on VLSI 2023</cTitle>: T1 <Title>Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3590261&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Chang, Yang A1 Xiang, Jing A1 Luo, Hao A1 Cui, Jie A1 Huang, Zhengfeng A1 Ni, Tianming A1 Wen, Xiaoqing PB ACM YR 2023 K1 double-node-upset K1 self-recoverability K1 soft error K1 sram K1 Hardware K1 Robustness K1 Fault tolerance K1 Redundancy SP 293 OP 298 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3583781.3590261 DO https://dl.acm.org/doi/10.1145/3583781.3590261 SF ELIB - SuUB Bremen
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