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1 Ergebnisse
1
A Low Area and Low Delay Latch Design with Complete Double-..:
, In:
Proceedings of the Great Lakes Symposium on VLSI 2023
,
Yan, Aibin
;
Wei, Shaojie
;
Zhang, Jinjun
... - p. 167-171 , 2023
Link:
https://dl.acm.org/doi/10.1145/3583781.3590281
RT T1
Proceedings of the Great Lakes Symposium on VLSI 2023
: T1
A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications
UL https://suche.suub.uni-bremen.de/peid=acm-3590281&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Wei, Shaojie A1 Zhang, Jinjun A1 Cui, Jie A1 Song, Jie A1 Ni, Tianming A1 Girard, Patrick A1 Wen, Xiaoqing PB ACM YR 2023 K1 circuit reliability K1 radiation hardening K1 robust computing. K1 soft error SP 167 OP 171 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3583781.3590281 DO https://dl.acm.org/doi/10.1145/3583781.3590281 SF ELIB - SuUB Bremen
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