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1
Towards Automated Identification of Layering Violations in ..:
, In:
Proceedings of the 24th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems
,
Shen, Mingjie
;
Davis, James C.
;
Machiry, Aravind
- p. 143-147 , 2023
Link:
https://dl.acm.org/doi/10.1145/3589610.3596271
RT T1 <cTitle>Proceedings of the 24th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems</cTitle>: T1 <Title>Towards Automated Identification of Layering Violations in Embedded Applications (WIP)</Title> UL https://suche.suub.uni-bremen.de/peid=acm-3596271&Exemplar=1&LAN=DE A1 Shen, Mingjie A1 Davis, James C. A1 Machiry, Aravind PB ACM YR 2023 K1 Embedded Systems K1 Firmware K1 Hardware Abstraction Layer K1 Portability K1 Static Analysis K1 Computer systems organization K1 Firmware K1 Embedded software SP 143 OP 147 LK http://dx.doi.org/https://dl.acm.org/doi/10.1145/3589610.3596271 DO https://dl.acm.org/doi/10.1145/3589610.3596271 SF ELIB - SuUB Bremen
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